Article Cited by others
ORIGINAL RESEARCHEvaluation of debris and smear layer removal with XP-endo finisher: A scanning electron microscopic studyJayakumaar Anita, Ganesh Arathi, Kalaiselvam Rajeswari, Rajan Mathan, Deivanayagam KandaswamyYear : 2019| Volume: 30| Issue : 3 | Page no: 420-423